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Bandpass filters for microwave frequencies realized with thin film bulk acoustic wave resonators (FBAR) are a promising alternative to current dielectric or surface acoustic wave filters for use in mobile telecommunication applications. With equivalent performance, FBAR filters are significantly smaller than dielectric filters and allow for a larger power operation than SAW filters. In addition, FBARs offer the possibility of on-chip integration, which will result in substantial volume and cost reduction. The first passive FBAR devices are now appearing on the market. They mainly cover needs in miniaturized RF-filters for the new bands around 2 GHz. A FBAR is essentially a thin piezoelectric plate sandwiched between two electrodes and acoustically isolated from the environment for energy trapping purposes. If the isolation is effectuated by an acoustic Bragg reflector, one speaks of solidly mounted resonators (SMR). Piezoelectric aluminum nitride (AlN) thin films are predominantly used in the emerging FBAR technology because AlN exhibits a sufficient electromechanical coupling coefficient kt2 , low acoustic losses at microwave frequencies, a low temperature coefficient of frequency, and its chemical composition is compatible with CMOS requirements. This thesis has two research directions. In the first part, FBAR structures based on AlN thin films were investigated for applications at X-band frequencies (7.2-8.5 GHz), i.e. operating at much higher frequencies than the ones used for present products. The goal was to identify property limitations related to such high frequencies, and to demonstrate to industry high performing SMR filters at 8 GHz. In the second part, a new material for FBAR devices was studied. The motivation is that AlN allows for a restricted filter bandwidth only, limited by its coupling factor of maximal 7%. Monocrystalline KNbO3 appears as an ideal alternative with its high coupling factor kt2 of 47%, and relatively large sound velocity of 8125m/s for longitudinal waves along the [101] direction. Piezoelectricity of KNbO3 films grown on electrodes has never been characterized. Single crystal results indicate that the optimal film texture would be (101). In this thesis, the growth of KNbO3 films on Pt electrodes was studied with the goal to achieve this texture uniformly, and to characterize piezoelectric properties. X-band FBAR's were first studied with numerical simulations based on a one-dimensional theory of the thickness-extensional bulk acoustic wave (BAW). Thickness, acoustic properties and electrical conductivity of the electrodes have a large impact on the resonator characteristics. There are conflicting requirements with respect to optimum acoustic and electrical properties of the electrode materials. An optimum thickness was calculated for 8GHz FBARs that use Pt bottom and Al top electrodes. The characteristics of ladder filters have been calculated based on the impedances of single resonators. The adjustable filter p