Neutron- and Proton-Induced Degradation of MOS Transistors in 28 nm CMOS Technology (September 2023)

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Neutron- and Proton-Induced Degradation of MOS Transistors in 28 nm CMOS Technology (September 2023)

Chattez avec Graph Search

Radiation Hardness of MALTA2, a Monolithic Active Pixel Sensor for Tracking Applications

Search for a high-mass dimuon resonance produced in association with b quark jets at √s=13 TeV

Integrated 4-terminal single-contact nanoelectromechanical relays implemented in a silicon-on-insulator foundry process

Multi-Gate FD-SOI Single Electron Transistor for hybrid SET-MOSFET quantum computing

Characterization of GigaRad Total Ionizing Dose and Annealing Effects on 28-nm Bulk MOSFETs

The LHCb Silicon Tracker

A 2.4-GHz low power polar transmitter for wireless body area network applications

First measurement of time-dependent CP violation in B-s(0) -> K+K- decays

Impact of high energy high intensity proton beams on targets: Case studies for Super Proton Synchrotron and Large Hadron Collider