Publication

Quantitative mapping of fast voltage pulses in tunnel junctions by plasmonic luminescence

Klaus Kern, Markus Etzkorn, Christoph Grosse
2013
Journal Articles

Résumé

An optical read-out technique is demonstrated that enables mapping the time-dependent electrostatic potential in the tunnel junction of a scanning tunneling microscope with millivolt and nanosecond accuracy. We measure the time-dependent intensity of plasmonic light emitted from the tunnel junction upon excitation with a nanosecond voltage pulse. The light intensity is found to be a quantitative measure of the voltage between tip and sample. This permits non-invasive mapping of fast voltage transients directly at the tunnel junction. Knowledge of the pulse profile reaching the tunnel junction is applied to optimize the experiment's time response by actively shaping the incident pulses. (c) 2013 AIP Publishing LLC.

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https://infoscience.epfl.ch/entities/publication/547b6b8e-f45b-4c50-a197-6849f2996009

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Klaus Kern, Markus Etzkorn, Christoph Grosse
2013
Journal Articles

Résumé

Source officielle

https://infoscience.epfl.ch/entities/publication/547b6b8e-f45b-4c50-a197-6849f2996009

À propos de ce résultat

Concepts associés (32)

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In electrical engineering and mechanical engineering, a transient response is the response of a system to a change from an equilibrium or a steady state. The transient response is not necessarily tied to abrupt events but to any event that affects the equilibrium of the system. The impulse response and step response are transient responses to a specific input (an impulse and a step, respectively). In electrical engineering specifically, the transient response is the circuit’s temporary response that will die out with time.

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