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Single crystal diamond micro-disk resonators by focused ion beam milling

Publications associées (25)

First operations with caesium of the negative ion source SPIDER

Riccardo Agnello, Michele Fadone, Alberto Ferro

The negative-ion based neutral beam injector for heating and current drive of the ITER plasma (ITER HNB) is under development, at present focusing on the optimization of the full-scale plasma source in the SPIDER test stand. The production of H- or D- ions ...

IOP Publishing Ltd2022

Equivariant Diffusion for Molecule Generation in 3D

Clément Arthur Yvon Vignac

This work introduces a diffusion model for molecule generation in 3D that is equivariant to Euclidean transformations. Our E(3) Equivariant Diffusion Model (EDM) learns to denoise a diffusion process with an equivariant network that jointly operates on bot ...

JMLR-JOURNAL MACHINE LEARNING RESEARCH2022

Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss Laboratories

Thomas Bovay, Lukas Baumgartner, Anders Meibom, Stéphane Laurent Escrig, Florent Olivier Vivien Plane

Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a localized area of a solid target by performing mass spectrometry on secondary ions sputtered from its surface by the impact of a beam of charged particles. ...

SWISS CHEMICAL SOC2022

Cost-Based Decision Support System: A Dynamic Cost Estimation of Key Performance Indicators in Manufacturing

Dimitrios Kyritsis, Foivos Psarommatis Giannakopoulos

An attempt is made to translate five generic key performance indicators (KPIs) into a continuous real-time cost function in a batch order-based manufacturing environment. The challenge of controlling and optimizing resource utilization, production efficien ...

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC2022

Ionic Liquid Gating of SrTiO3 Lamellas Fabricated with a Focused Ion Beam

Evgeny Mikheev, Amelia Emily-Kay Estry, Philip Johannes Walter Moll

In this work, we combine two previously incompatible techniques for defining electronic devices: shaping three-dimensional crystals by focused ion beam (FIB), and two-dimensional electrostatic accumulation of charge carriers. The principal challenge for th ...

AMER CHEMICAL SOC2022