Tilting Catalyst-Free InAs Nanowires by 3D-Twinning and Unusual Growth Directions

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Publications associées (31)

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Three-point bending tests were performed on double-anchored, < 110 > silicon nanowire samples in the vacuum chamber of a scanning electron microscope ( SEM) via a micromanipulator equipped with a piezoresistive force sensor. Nanowires with widths of 35nm a ...

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