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Increasing the scanning speed in Atomic Force Microscopy (AFM) relies on improving the tracking performance in the vertical direction of motion. The lightly damped resonances of piezo-actuators utilized in AFM nano-positioning stages hinder the maximum ach ...
X-ray powder diffraction (XRD) was used to characterize and quantify nano-crystalline C-S-H in hydrated tricalcium silicate (C3S), Portland cement, and siliceous fly ash blended cement using Rietveld analysis with partial or no known crystal structure (PON ...
Mechanical tests and microscopy studies on body-centered cubic (BCC) high entropy alloys reveal transitions from screw to edge dislocation slip and from {110} to {112} slip plane activity. Here, a strengthening theory for BCC edge dislocation slip on {112} ...