CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity

Mihai Adrian Ionescu, Francesco Bellando, Hoël Maxime Guérin, Junrui Zhang, Fabien Patrick Wildhaber, Erick Antonio Garcia Cordero, Maneesha Rupakula, Johan Frédéric Longo
2018
Conference Papers

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Mihai Adrian Ionescu, Francesco Bellando, Hoël Maxime Guérin, Junrui Zhang, Fabien Patrick Wildhaber, Erick Antonio Garcia Cordero, Maneesha Rupakula, Johan Frédéric Longo
2018
Conference Papers

Source officielle

Publications associées (11)

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https://infoscience.epfl.ch/entities/publication/140eda44-2090-4f45-9f6e-e413a1662c54

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Publications associées (11)

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