Michal Stanislaw Smreczak

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Monolithic integrated circuits (ICs) have been miniaturized over the past five decades, and today their components range in size from hundreds of microns to several nanometers. Making point contact with electrical samples under a microscope is referred to ...

In this paper, we present a new flexure-based load cell with adjustable stiffness designed for force sensors with extended force range and respective measuring resolution. This novel monolithic mechanism consists of a T-shaped flexure pivot combined with a ...

Flexure pivot based system (1) being one of: a force sensor, a force limiting device arranged to exert a predetermined threshold force, a torque limiting device arranged to exert a predetermined threshold torque, a programmable mechanical memory, or an acc ...

This article describes a novel method for applying a contact force in the range of 1 to 100 μN with pointed probe on a microscale sample in order to perform ohmic electrical measurements. The solution is based on the new TIVOT active load cell combining th ...

The tasks of electrical micro- and nanoprobing require precision that goes beyond human perception and therefore, depend on sensors providing real-time feedback. Efforts towards automation in micro- and nanoprobing and emerging areas such as branched nanow ...

Michal Stanislaw Smreczak

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Load cell with positive, negative and zero stiffness operating modes for milli- to nanonewton contact force monitoring in electrical probing

Load cell with adjustable stiffness based on a preloaded T-shaped flexure pivot

Flexure pivot based system

Active load cell with positive, negative and zero stiffness operating modes for micronewton range contact force monitoring in electrical probing

A load cell with adjustable stiffness and zero offset tuning dedicated to electrical micro- and nanoprobing