Publications de Klaus Leifer | EPFL Graph Search

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Klaus Leifer

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Localization of Excitons in Disordered Quantum Wires Probed by Single Photon Correlation Spectroscopy

Growth and structural characterization of Ni/Ti supermirrors for neutrons

Strain Mapping of V-Groove InGaAs/GaAs Strained Quantum Wires Using Cross Sectional Atomic Force Microscopy

Dense Uniform Arrays of Site-Controlled GaAs/AlGaAs Quantum Dots Grown in Inverted Pyramids

Structural characterization of short-period Si/sub m/Ge/sub n/ superlattices by transmission electron microscopy and X-ray diffraction

PEELS Imaging and Linescan Study of Concentration Anisotropies in AlxGa1-xAs and InyGa1-yAs Heterostructures Grown on Non-Planar Substrates

Theoretical and experimental limits of the quantitative analysis of III/V semiconductors using EELS

Wave-function splitting due to a two-dimensional quantum confined Stark effect in quantum wires

Structural and chemical characterisation of Ni/Ti multilayers with TEM

Effect of Indium Segregation on Optical Properties of V-Groove InGaAs/GaAs Strained Quantum Wires

Use of quantitative EELS and cathodoluminescence for study of carrier confinement and diffusion in self organised vertical quantum wells

Characterization of Multilayers for Neutron optics

Chemical analysis of Ni/Ti multilayers by PEELs and EDS

Electron beam induced deposition of rhodium from the precursor [RhCl(PF3)2]2: morphology, structure and chemical composition

Studies of deposition order anomaly of exchange coupling in bilayers and trilayers of NiFe and CoO

Strained V-groove quantum wires in multidimensional microcavities

Characterization of short-period Si/sub m/Ge/sub n/ superlattices by high-resolution transmission electron microscopy and X-ray diffraction

Electrolominescence and photoluminescence excitation study of asymmetric coupled GaAs/AlGaAs V-groove quantum wires

Quantitative Imaging of InGaAs/GaAs Layers Using Transmission Electron Microscopy Methods: Characterization of Stresses and Chemical Composition

Formation of Semiconductor Vertical Quantum Barriers by Epitaxial growth on Corrugated Surfaces