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Concept

Diffraction from slits

Publications associées (30)

Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses

Christoph Bostedt

X-ray free-electron lasers (XFELs) deliver ultrashort coherent laser pulses in the X-ray spectral regime, enabling novel investigations into the structure of individual nanoscale samples. In this work, we demonstrate how single-shot small-angle X-ray scatt ...

2019

Parameter-free image resolution estimation based on decorrelation analysis

Aleksandra Radenovic, Adrien Charles-François Raymond Descloux, Kristin Stefanie Grussmayer

Super-resolution microscopy opened diverse new avenues of research by overcoming the resolution limit imposed by diffraction. Exploitation of the fluorescent emission of individual fluorophores made it possible to reveal structures beyond the diffraction l ...

Nature Publishing Group2019

Resonant Waveguide Gratings for Color-Selective Diffraction

Giorgio Quaranta

Resonant waveguide gratings (RWGs), also known as guided mode resonant (GMR) gratings or waveguide-mode resonant gratings, are dielectric structures where these resonant diffractive elements benefit from lateral leaky guided modes and can operate from UV t ...

EPFL2019

Quantification of amorphous siliceous fly ash in hydrated blended cement pastes by X-ray powder diffraction

Karen Scrivener, Ruben Anton Snellings, Xuerun Li

X-ray powder diffraction (XRPD)-based quantitative phase analysis is a common technique for studying the hydration of cementitious systems. Hydrated cements often comprise several amorphous or nanocrystalline phases. This paper presents a protocol for the ...

INT UNION CRYSTALLOGRAPHY2019

Holographic device or imager

Christophe Moser, Manon Rostykus

The present disclosure concerns a holographic system or device comprising at least one optical guiding element (100) configured to redirect light incident from a light source (101) to a target interference plane (103), wherein the optical guiding element i ...

2018

Mask-aligner Talbot lithography using a 193 nm CW light source

Toralf Scharf, Wilfried Noell, Raoul Kirner

We present and discuss Talbot mask-aligner lithography, relying on a continuous wave laser emitting at 193nm for the illumination. In this source, a diode laser at 772nm is amplified by a tapered amplifier in master-oscillator power-amplifier configuration ...

2018

Feasibility study on a novel daylighting system with embedded micro compound parabolic concentrators (CPCs)

Jean-Louis Scartezzini, Andreas Schueler, André Gabriel Kostro, Jing Gong

A novel glazing system consisting of a polymer layer with embedded micro compound parabolic concentrators (CPCs), which is attached to a glass pane of glazing, is proposed. It aims to reduce the energy consumption due to cooling in buildings, provide dayli ...

SPIE-INT SOC OPTICAL ENGINEERING2018

Free-electron-laser coherent diffraction images of individual drug-carrying liposome particles in solution

Giorgio Margaritondo

Using the excellent performances of a SACLA (RIKEN/HARIMA, Japan) X-ray free electron laser (X-FEL), coherent diffraction imaging (CDI) was used to detect individual liposome particles in water, with or without inserted doxorubicin nanorods. This was possi ...

2018

Light fields behind microstructures: study of the Babinet-principle in the Fresnel regime

Hans Peter Herzig, Toralf Scharf, Myun Sik Kim, Krishnaparvathy Puthankovilakam

The Babinet’s principle is a general theorem that holds for electromagnetic waves and is often applied to diffraction of light. Diffraction pattern of a body and that of the complement body are compared and the sum of both radiation patterns must be the sa ...

Spie-Int Soc Optical Engineering2017

Ultrafast Laser to Tailor Material Properties: An Enabling Tool in Advanced Three-dimensional Micromanufacturing

Yves Bellouard

The progress made in ultrafast laser technology towards high repetition rate systems have opened new opportunities in micromanufacturing. Non-linear absorption phenomena triggered by femtosecond pulses interacting with transparent materials allow material ...

Swiss Chemical Soc2017