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Concept

Microscope

Publications associées (29)

Investigations on Caesium Dispersion and Molybdenum Coating on SPIDER Components

Basile Marie Jacques Pouradier Duteil

SPIDER is the 100 keV full-size Negative Ion Source prototype of the ITER Neutral Beam Injector, operating at Consorzio RFX in Padova, Italy. The largest Negative Ion Source in the world, SPIDER generates an RF driven plasma from which Deuterium or Hydroge ...

2023

Optical manipulation of plasmonic nanoparticles: Applications in surface chemistry and nano-optics

Jeonghyeon Kim

Optical tweezers are devices that can manipulate nano- and microparticles using a laser. The principle of optical tweezers is to apply a force to an object using the momentum of light. This force is very small, but it is sufficient to move things in the mi ...

EPFL2023

Method and light microscope with a plurality of arrays of photon-counting detector elements

Edoardo Charbon, Claudio Bruschini, Ivan Michel Antolovic

A method for operating a light microscope comprises emitting and guiding a plurality of illumination light beams towards a specimen (6) to form a plurality of separated illumination light spots (2A, 2B, 2C, 2D) at the specimen; and guiding detection light ...

2022

Advanced Techniques in Optical Diffraction Tomography

Ahmed Bassam Sayed Ayoub Mohamed Emam

In this thesis, we study the 3 challenges described above. First, we study different reconstruction techniques and assess the fidelity of each reconstruction results by means of structured illumination and phase conjugation. By reconstructing the 3D refrac ...

EPFL2022

Pitfalls in the spectral measurements of polarization-altering metasurfaces

Olivier Martin, Hsiang-Chu Wang

The optical characterization of metasurfaces and nanostructures that alter the polarization of light is tricky and can lead to unphysical results, such as reflectance beyond unity. We track the origin of such pitfalls to the response of some typical optica ...

Optica Publishing Group2022

Load cell with positive, negative and zero stiffness operating modes for milli- to nanonewton contact force monitoring in electrical probing

Michal Stanislaw Smreczak

Monolithic integrated circuits (ICs) have been miniaturized over the past five decades, and today their components range in size from hundreds of microns to several nanometers. Making point contact with electrical samples under a microscope is referred to ...

EPFL2022

Extracting transport channel transmissions in scanning tunneling microscopy using superconducting excess current

Klaus Kern, Jacob Senkpiel

Transport through quantum coherent conductors, such as atomic junctions, is described by conduction channels. Information about the number of channels and their transmissions can be extracted from various sources, such as multiple Andreev reflections, dyna ...

AMER PHYSICAL SOC2022

Effect of chromium content on microstructural evolution of CoNiAlW superalloy

Cyril Cayron

Effects of chromium (Cr) content on types and morphologies of various phases of a newly developed Co-Ni-Al-W superalloy (Co-30Ni-6W-9Al-3Ti-1Ta) have been investigated in this study. Microstructural examinations were carried out by field-emission scanning ...

SPRINGER HEIDELBERG2022

Microsecond melting and revitrification of cryo samples with a correlative light-electron microscopy approach

Marcel Drabbels, Gabriele Bongiovanni, Oliver Florian Harder

We have recently introduced a novel approach to time-resolved cryo-electron microscopy (cryo-EM) that affords microsecond time resolution. It involves melting a cryo sample with a laser beam to allow dynamics of the embedded particles to occur. Once the la ...

2022