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In this work, a set of low-temperature thick-film dielectrics consisting of two high-lead low-temperature glasses, stabilised by various amounts of alumina filler, is characterised on alumina and aluminium metal, as a function of firing temperature. Corresponding resistors based on the same glasses as the dielectrics, but with RuO2 as a conductive phase, were studied on the dielectrics. The purpose of these materials is to enable deposition of thick- film electronics onto substrates such as glass and metals (steel, aluminium, brass, titanium), which cannot be exposed to the standard high-temperature 850°C thick-film firing cycle. Satisfactory insulating properties were obtained, and the properties of the resulting resistors are promising, but managing thermal mismatch was found to be a major issue regarding the mechanical integrity.
Raffaella Buonsanti, Anna Loiudice, Ona Segura Lecina, Petru Pasquale Albertini, Philippe Benjamin Green, Krishna Kumar, Mark Adrian Newton, Jari Leemans, Coline Marie Agathe Boulanger
Raffaella Buonsanti, Philippe Benjamin Green, Alexander Nicolas Chen