Publication

Determining alloy composition in MoxW(1-x)S2 from low wavenumber Raman spectroscopy

2017
Journal Articles

Abstract

Mixed alloy MoxW(1-x)S2 (0x1) bulk samples are characterized by low wavenumber Raman spectroscopy. The results provide a convenient and reliable means for systematically determining the sample Mo/W composition. The absence of disorder effects in its interlayer motion (unlike for the intralayer motion) and the lack of Mo/W composition dependence of the shear mode force constants enable the facile employment of a reduced monoatomic linear chain model by treating the bulk alloy as a series of single balls' of mass (xm(Mo)+(1-x)m(W)+2m(S))attached by interlayer springs with a composition-independent interlayer force constant of 2.52Nm. Shear mode Raman scattering analysis may consequently be complementary to the electronic spectroscopy tools (X-ray photoelectron spectroscopy (XPS) and energy-dispersive X-ray spectroscopy (EDS)), commonly used for mixed alloy bulk composition characterization. Copyright (c) 2017 John Wiley & Sons, Ltd.

Official source

https://infoscience.epfl.ch/entities/publication/f797c584-45f3-434c-bf33-9804d4de1dc1

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Graph Chat

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

2017
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/f797c584-45f3-434c-bf33-9804d4de1dc1

About this result

Related concepts (32)

X-ray photoelectron spectroscopy

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to.

Spectroscopy

Spectroscopy is the field of study that measures and interprets the electromagnetic spectra that result from the interaction between electromagnetic radiation and matter as a function of the wavelength or frequency of the radiation. Matter waves and acoustic waves can also be considered forms of radiative energy, and recently gravitational waves have been associated with a spectral signature in the context of the Laser Interferometer Gravitational-Wave Observatory (LIGO).

X-ray spectroscopy

X-ray spectroscopy is a general term for several spectroscopic techniques for characterization of materials by using x-ray radiation. When an electron from the inner shell of an atom is excited by the energy of a photon, it moves to a higher energy level. When it returns to the low energy level, the energy which it previously gained by the excitation is emitted as a photon which has a wavelength that is characteristic for the element (there could be several characteristic wavelengths per element).

Related publications (32)

Determining alloy composition in MoxW(1-x)S2 from low wavenumber Raman spectroscopy

Chat with Graph Search

Applications of the thawed Gaussian approximation to electronic spectroscopy

A compact approach to higher-resolution resonant inelastic x-ray scattering detection using photoelectrons

Controlling crystal cleavage in focused ion beam shaped specimens for surface spectroscopy