X-ray crystallographyX-ray crystallography is the experimental science determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract into many specific directions. By measuring the angles and intensities of these diffracted beams, a crystallographer can produce a three-dimensional picture of the density of electrons within the crystal. From this electron density, the mean positions of the atoms in the crystal can be determined, as well as their chemical bonds, their crystallographic disorder, and various other information.
Powder diffractionPowder diffraction is a scientific technique using X-ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. An instrument dedicated to performing such powder measurements is called a powder diffractometer. Powder diffraction stands in contrast to single crystal diffraction techniques, which work best with a single, well-ordered crystal. Diffraction grating The most common type of powder diffraction is with x-rays, the focus of this article although some aspects of neutron powder diffraction are mentioned.
X-ray scattering techniquesX-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystal structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy.
EpitaxyEpitaxy (prefix epi- means "on top of”) refers to a type of crystal growth or material deposition in which new crystalline layers are formed with one or more well-defined orientations with respect to the crystalline seed layer. The deposited crystalline film is called an epitaxial film or epitaxial layer. The relative orientation(s) of the epitaxial layer to the seed layer is defined in terms of the orientation of the crystal lattice of each material.
Crystal structureIn crystallography, crystal structure is a description of the ordered arrangement of atoms, ions, or molecules in a crystalline material. Ordered structures occur from the intrinsic nature of the constituent particles to form symmetric patterns that repeat along the principal directions of three-dimensional space in matter. The smallest group of particles in the material that constitutes this repeating pattern is the unit cell of the structure.
Reciprocal latticeIn physics, the reciprocal lattice represents the Fourier transform of another lattice. The direct lattice or real lattice is a periodic function in physical space, such as a crystal system (usually a Bravais lattice). The reciprocal lattice exists in the mathematical space of spatial frequencies, known as reciprocal space or k space, where refers to the wavevector. In quantum physics, reciprocal space is closely related to momentum space according to the proportionality , where is the momentum vector and is the reduced Planck constant.
Structure factorIn condensed matter physics and crystallography, the static structure factor (or structure factor for short) is a mathematical description of how a material scatters incident radiation. The structure factor is a critical tool in the interpretation of scattering patterns (interference patterns) obtained in X-ray, electron and neutron diffraction experiments. Confusingly, there are two different mathematical expressions in use, both called 'structure factor'.
X-ray fluorescenceX-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science, archaeology and art objects such as paintings.
X-ray spectroscopyX-ray spectroscopy is a general term for several spectroscopic techniques for characterization of materials by using x-ray radiation. When an electron from the inner shell of an atom is excited by the energy of a photon, it moves to a higher energy level. When it returns to the low energy level, the energy which it previously gained by the excitation is emitted as a photon which has a wavelength that is characteristic for the element (there could be several characteristic wavelengths per element).
Neutron diffractionNeutron diffraction or elastic neutron scattering is the application of neutron scattering to the determination of the atomic and/or magnetic structure of a material. A sample to be examined is placed in a beam of thermal or cold neutrons to obtain a diffraction pattern that provides information of the structure of the material. The technique is similar to X-ray diffraction but due to their different scattering properties, neutrons and X-rays provide complementary information: X-Rays are suited for superficial analysis, strong x-rays from synchrotron radiation are suited for shallow depths or thin specimens, while neutrons having high penetration depth are suited for bulk samples.
Liquid crystalLiquid crystal (LC) is a state of matter whose properties are between those of conventional liquids and those of solid crystals. For example, a liquid crystal may flow like a liquid, but its molecules may be oriented in a crystal-like way. There are many types of LC phases, which can be distinguished by their optical properties (such as textures). The contrasting textures arise due to molecules within one area of material ("domain") being oriented in the same direction but different areas having different orientations.
Point reflectionIn geometry, a point reflection (also called a point inversion or central inversion) is an transformation of affine space in which every point is reflected across a specific fixed point. A point reflection is an involution: applying it twice is the identity transformation. It is equivalent to a homothetic transformation with scale factor −1. The point of inversion is also called homothetic center. An object that is invariant under a point reflection is said to possess point symmetry; if it is invariant under point reflection through its center, it is said to possess central symmetry or to be centrally symmetric.
Precession electron diffractionPrecession electron diffraction (PED) is a specialized method to collect electron diffraction patterns in a transmission electron microscope (TEM). By rotating (precessing) a tilted incident electron beam around the central axis of the microscope, a PED pattern is formed by integration over a collection of diffraction conditions. This produces a quasi-kinematical diffraction pattern that is more suitable as input into direct methods algorithms to determine the crystal structure of the sample.
Reflection mappingIn computer graphics, environment mapping, or reflection mapping, is an efficient technique for approximating the appearance of a reflective surface by means of a precomputed texture. The texture is used to store the of the distant environment surrounding the rendered object. Several ways of storing the surrounding environment have been employed. The first technique was sphere mapping, in which a single texture contains the image of the surroundings as reflected on a spherical mirror.
Reflection symmetryIn mathematics, reflection symmetry, line symmetry, mirror symmetry, or mirror-image symmetry is symmetry with respect to a reflection. That is, a figure which does not change upon undergoing a reflection has reflectional symmetry. In 2D there is a line/axis of symmetry, in 3D a plane of symmetry. An object or figure which is indistinguishable from its transformed image is called . In conclusion, a line of symmetry splits the shape in half and those halves should be identical.
Thin filmA thin film is a layer of material ranging from fractions of a nanometer (monolayer) to several micrometers in thickness. The controlled synthesis of materials as thin films (a process referred to as deposition) is a fundamental step in many applications. A familiar example is the household mirror, which typically has a thin metal coating on the back of a sheet of glass to form a reflective interface. The process of silvering was once commonly used to produce mirrors, while more recently the metal layer is deposited using techniques such as sputtering.
Gallium arsenideGallium arsenide (GaAs) is a III-V direct band gap semiconductor with a zinc blende crystal structure. Gallium arsenide is used in the manufacture of devices such as microwave frequency integrated circuits, monolithic microwave integrated circuits, infrared light-emitting diodes, laser diodes, solar cells and optical windows. GaAs is often used as a substrate material for the epitaxial growth of other III-V semiconductors, including indium gallium arsenide, aluminum gallium arsenide and others.
Glide reflectionIn 2-dimensional geometry, a glide reflection (or transflection) is a symmetry operation that consists of a reflection over a line and then translation along that line, combined into a single operation. The intermediate step between reflection and translation can look different from the starting configuration, so objects with glide symmetry are in general, not symmetrical under reflection alone. In group theory, the glide plane is classified as a type of opposite isometry of the Euclidean plane.
Reflection (mathematics)In mathematics, a reflection (also spelled reflexion) is a mapping from a Euclidean space to itself that is an isometry with a hyperplane as a set of fixed points; this set is called the axis (in dimension 2) or plane (in dimension 3) of reflection. The image of a figure by a reflection is its in the axis or plane of reflection. For example the mirror image of the small Latin letter p for a reflection with respect to a vertical axis (a vertical reflection) would look like q.
Solar azimuth angleThe solar azimuth angle is the azimuth (horizontal angle with respect to north) of the Sun's position. This horizontal coordinate defines the Sun's relative direction along the local horizon, whereas the solar zenith angle (or its complementary angle solar elevation) defines the Sun's apparent altitude. There are several conventions for the solar azimuth; however, it is traditionally defined as the angle between a line due south and the shadow cast by a vertical rod on Earth.
