Publication

Direct observation of the B-site cationic order in the ferroelectric relaxor Pb(Mg1/3Ta2/3)O-3

Nava Setter, Marco Cantoni, Sandrine Traversa Gentil
2004
Journal Articles

Abstract

By means of transmission electron microscopy (TEM) the structure of chemically ordered regions in Zr-doped Pb(Mg1/3Ta2/3)O-3 has been studied. Large coherent ordered domains were obtained by the addition of 5 mol% PbZrO3. The results obtained by conventional, analytical, and high-resolution TEM are consistent with the random-site description of the B-site order, the so-called random-layer model. Image simulations showed that a careful selection of the imaging conditions for high resolution transmission electron microscopy is necessary in order to determine the different B-site occupancies. By comparison of simulated with experimental images it was possible to directly distinguish between the different ordering models. (C) 2004 American Institute of Physics.

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https://infoscience.epfl.ch/entities/publication/dc57ba91-d058-40cb-9a91-d61e65c3859a

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Nava Setter, Marco Cantoni, Sandrine Traversa Gentil
2004
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/dc57ba91-d058-40cb-9a91-d61e65c3859a

About this result

Related concepts (25)

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Related publications (26)

Direct observation of the B-site cationic order in the ferroelectric relaxor Pb(Mg1/3Ta2/3)O-3

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