Publication

Preparation and application of minerals-based sacrificial pastes for fabrication of LTCC structures

Thomas Maeder, Peter Ryser
2006
Conference Papers

Abstract

This work presents the preliminary results on application of mineral sacrificial layer that is prepared to structure LTCC (low temperature co-fired ceramic). The proposed method suggests utilization of a sacrificial paste, which remains "permanent" during firing and later removed by chemical dissolution, thus providing an effective support throughout the firing. The paste is based on a mixture of B2O3 and alkaline earth oxides and screen-printed on an LTCC sheet that is laminated with additional LTCC layers. B2O3 forms a consolidated structure by melting at low temperatures (400 °C) and wetting alkaline oxide with high melting temperature (>2000 °C), which can, after firing, be removed easily by chemicals. The basic characteristics that the pastes should possess can be summarized as: adequately formulated composition to allow easy etching, prevention of excessive reaction with the LTCC, matching shrinkage behaviour with LTCC. TGA (thermo gravimetric analysis), SDTA (single differential thermal analysis), XRD (X-ray diffraction) and SEM (scanning electron microscopy) will be the means of analysis to characterize the processed materials and fabricated structure, respectively.

Official source

https://infoscience.epfl.ch/entities/publication/d9c2713d-1b8a-4f57-82fa-14c9ac4a016c

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Thomas Maeder, Peter Ryser
2006
Conference Papers

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/d9c2713d-1b8a-4f57-82fa-14c9ac4a016c

About this result

Related concepts (32)

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

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Preparation and application of minerals-based sacrificial pastes for fabrication of LTCC structures

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