Publication

Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

Matthias Bucher
2020
Conference Papers

Abstract

We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.

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Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

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