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A high capacitive ratio RF MEMS switch, with low-actuation voltage is designed, fabricated and experimentally validated on high-resistivity silicon (HRS) substrate. Thanks to very good fabrication control of all steps and to the high dielectric constant of TiO2, a down/up capacitive ratio close to 200 is achieved with 8 V pull-in. It is also demonstrated that, using a passivated-surface HRS and semi-suspended conductors on air, the microwave losses in the CPW line are as low as 0.1 dB/mm at 20 GHz. The reported RF MEMS shunt capacitor is expected to serve as core device for phase shifting applications in the 10-20 GHz range, both for switching operations and as a variable capacitor in distributed MEMS transmission lines (DMTLs).
Romain Christophe Rémy Fleury, Amir Jafargholi
Yves Perriard, Yoan René Cyrille Civet, Paolo Germano, Thomas Guillaume Martinez, Alexis Boegli, Stefania Maria Aliki Konstantinidi, Quentin Philippe Mario De Menech