Publication

PZT coated optical fibers for acousto-optical modulation

Nava Setter, Paul Muralt
1999
Journal Articles

Abstract

Piezoelectric coatings of PbZrxTi1-xO3 (PZT) were deposited on standard telecommunication fibers. The PZT coatings were produced by reactive de magnetron sputtering of metal targets in pure oxygen atmosphere. The deposition was carried out at substrate temperatures between 500 and 600 degrees C. Film thicknesses are in the range of 1300 to 1500 nm. The device structure under investigation is of the Ti/Pt/PZT/Au type. X-ray diffraction (XRD) scanning electron microscopy (SEM), and electrical measurements were used to characterize the films. Results on crystalline phase formation, microstructure, and ferroelectric behavior of the axially symmetric coatings are presented.

Official source

https://infoscience.epfl.ch/entities/publication/ccf181c1-41f0-4b5e-ad5e-d3480df671fd

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Nava Setter, Paul Muralt
1999
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/ccf181c1-41f0-4b5e-ad5e-d3480df671fd

About this result

Related concepts (32)

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Related publications (4)

PZT coated optical fibers for acousto-optical modulation

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