ForceIn physics, a force is an influence that can cause an object to change its velocity, i.e., to accelerate, unless counterbalanced by other forces. The concept of force makes the everyday notion of pushing or pulling mathematically precise. Because the magnitude and direction of a force are both important, force is a vector quantity. It is measured in the SI unit of newton (N) and often represented by the symbol F.
Electric fieldAn electric field (sometimes E-field) is the physical field that surrounds electrically charged particles and exerts force on all other charged particles in the field, either attracting or repelling them. It also refers to the physical field for a system of charged particles. Electric fields originate from electric charges and time-varying electric currents. Electric fields and magnetic fields are both manifestations of the electromagnetic field, one of the four fundamental interactions (also called forces) of nature.
ElectrostaticsElectrostatics is a branch of physics that studies slow-moving or stationary electric charges. Since classical times, it has been known that some materials, such as amber, attract lightweight particles after rubbing. The Greek word for amber, ἤλεκτρον (), was thus the source of the word 'electricity'. Electrostatic phenomena arise from the forces that electric charges exert on each other. Such forces are described by Coulomb's law.
Action at a distanceIn physics, action at a distance is the concept that an object can be affected without being physically touched (as in mechanical contact) by another object. That is, it is the non-local interaction of objects that are separated in space. Non-contact forces is action at a distance affecting specifically an object's motion. This term was used most often in the context of early theories of gravity and electromagnetism to describe how an object responds to the influence of distant objects.
Atomic force microscopyAtomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Electromagnetic fieldAn electromagnetic field (also EM field or EMF) is a classical (i.e. non-quantum) field produced by moving electric charges. It is the field described by classical electrodynamics (a classical field theory) and is the classical counterpart to the quantized electromagnetic field tensor in quantum electrodynamics (a quantum field theory). The electromagnetic field propagates at the speed of light (in fact, this field can be identified as light) and interacts with charges and currents.
Coulomb's lawCoulomb's inverse-square law, or simply Coulomb's law, is an experimental law of physics that calculates the amount of force between two electrically charged particles at rest. This electric force is conventionally called electrostatic force or Coulomb force. Although the law was known earlier, it was first published in 1785 by French physicist Charles-Augustin de Coulomb, hence the name. Coulomb's law was essential to the development of the theory of electromagnetism and maybe even its starting point, as it allowed meaningful discussions of the amount of electric charge in a particle.
Static forces and virtual-particle exchangeStatic force fields are fields, such as a simple electric, magnetic or gravitational fields, that exist without excitations. The most common approximation method that physicists use for scattering calculations can be interpreted as static forces arising from the interactions between two bodies mediated by virtual particles, particles that exist for only a short time determined by the uncertainty principle. The virtual particles, also known as force carriers, are bosons, with different bosons associated with each force.
Kelvin probe force microscopeKelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. When there is little or no magnification, this approach can be described as using a scanning Kelvin probe (SKP). These techniques are predominantly used to measure corrosion and coatings. With KPFM, the work function of surfaces can be observed at atomic or molecular scales.
Dimensional analysisIn engineering and science, dimensional analysis is the analysis of the relationships between different physical quantities by identifying their base quantities (such as length, mass, time, and electric current) and units of measurement (such as metres and grams) and tracking these dimensions as calculations or comparisons are performed. The term dimensional analysis is also used to refer to conversion of units from one dimensional unit to another, which can be used to evaluate scientific formulae.
Line of forceA line of force in Faraday's extended sense is synonymous with Maxwell's line of induction. According to J.J. Thomson, Faraday usually discusses lines of force as chains of polarized particles in a dielectric, yet sometimes Faraday discusses them as having an existence all their own as in stretching across a vacuum. In addition to lines of force, J.J. Thomson—similar to Maxwell—also calls them tubes of electrostatic inductance, or simply Faraday tubes.
Plane waveIn physics, a plane wave is a special case of wave or field: a physical quantity whose value, at any moment, is constant through any plane that is perpendicular to a fixed direction in space. For any position in space and any time , the value of such a field can be written as where is a unit-length vector, and is a function that gives the field's value as dependent on only two real parameters: the time , and the scalar-valued displacement of the point along the direction . The displacement is constant over each plane perpendicular to .
Electrostatic inductionElectrostatic induction, also known as "electrostatic influence" or simply "influence" in Europe and Latin America, is a redistribution of electric charge in an object that is caused by the influence of nearby charges. In the presence of a charged body, an insulated conductor develops a positive charge on one end and a negative charge on the other end. Induction was discovered by British scientist John Canton in 1753 and Swedish professor Johan Carl Wilcke in 1762.
Centrifugal forceIn Newtonian mechanics, the centrifugal force is an inertial force (also called a "fictitious" or "pseudo" force) that appears to act on all objects when viewed in a rotating frame of reference. It is directed away from an axis which is parallel to the axis of rotation and passing through the coordinate system's origin. If the axis of rotation passes through the coordinate system's origin, the centrifugal force is directed radially outwards from that axis.
PerpendicularIn elementary geometry, two geometric objects are perpendicular if their intersection forms right angles (angles that are 90 degrees or π/2 radians wide) at the point of intersection called a foot. The condition of perpendicularity may be represented graphically using the perpendicular symbol, ⟂. Perpendicular intersections can happen between two lines (or two line segments), between a line and a plane, and between two planes.
TorqueIn physics and mechanics, torque is the rotational analogue of linear force. It is also referred to as the moment of force (also abbreviated to moment). It describes the rate of change of angular momentum that would be imparted to an isolated body. The concept originated with the studies by Archimedes of the usage of levers, which is reflected in his famous quote: "Give me a lever and a place to stand and I will move the Earth". Just as a linear force is a push or a pull applied to a body, a torque can be thought of as a twist applied to an object with respect to a chosen point.
Scalar fieldIn mathematics and physics, a scalar field is a function associating a single number to every point in a space – possibly physical space. The scalar may either be a pure mathematical number (dimensionless) or a scalar physical quantity (with units). In a physical context, scalar fields are required to be independent of the choice of reference frame. That is, any two observers using the same units will agree on the value of the scalar field at the same absolute point in space (or spacetime) regardless of their respective points of origin.
Iterative methodIn computational mathematics, an iterative method is a mathematical procedure that uses an initial value to generate a sequence of improving approximate solutions for a class of problems, in which the n-th approximation is derived from the previous ones. A specific implementation with termination criteria for a given iterative method like gradient descent, hill climbing, Newton's method, or quasi-Newton methods like BFGS, is an algorithm of the iterative method.
Numerical analysisNumerical analysis is the study of algorithms that use numerical approximation (as opposed to symbolic manipulations) for the problems of mathematical analysis (as distinguished from discrete mathematics). It is the study of numerical methods that attempt at finding approximate solutions of problems rather than the exact ones. Numerical analysis finds application in all fields of engineering and the physical sciences, and in the 21st century also the life and social sciences, medicine, business and even the arts.
Display resolutionThe display resolution or display modes of a digital television, computer monitor or display device is the number of distinct pixels in each dimension that can be displayed. It can be an ambiguous term especially as the displayed resolution is controlled by different factors in cathode ray tube (CRT) displays, flat-panel displays (including liquid-crystal displays) and projection displays using fixed picture-element (pixel) arrays. It is usually quoted as , with the units in pixels: for example, means the width is 1024 pixels and the height is 768 pixels.
