Publication

Compound clusters

Hans Georg Limberger
1988
Conference Papers

Abstract

The cluster beam technique offers promise of becoming a useful tool for chemists in their search for new compounds. Using this technique elemental vapors can be made to react under controlled conditions to form units of condensed matter (clusters) small enough to be analyzed in a mass spectrometer, but still large enough to contain several structural building blocks. Periodic patterns in cluster mass spectra often allow these building blocks to be uniquely indentified. Of particular interest is the identification of building blocks unknown in the crystalline state. The mass spectrometer has been used primarily to measure the number of atoms in elemental clusters; Xe/sub 55/, Na/sub 20/, Si/sub 10/, Ge/sub 10/ and C/sub 60/. The authors emphasize a slightly different aspect of mass spectrometry. The technique can be used to chemically analyze compound clusters.

Official source

https://infoscience.epfl.ch/entities/publication/ca7500fa-2e3b-4f06-98d8-3904501e1590

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Hans Georg Limberger
1988
Conference Papers

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/ca7500fa-2e3b-4f06-98d8-3904501e1590

About this result

Related concepts (32)

Mass spectrometry

Mass spectrometry (MS) is an analytical technique that is used to measure the mass-to-charge ratio of ions. The results are presented as a mass spectrum, a plot of intensity as a function of the mass-to-charge ratio. Mass spectrometry is used in many different fields and is applied to pure samples as well as complex mixtures. A mass spectrum is a type of plot of the ion signal as a function of the mass-to-charge ratio.

Tandem mass spectrometry

Tandem mass spectrometry, also known as MS/MS or MS2, is a technique in instrumental analysis where two or more mass analyzers are coupled together using an additional reaction step to increase their abilities to analyse chemical samples. A common use of tandem MS is the analysis of biomolecules, such as proteins and peptides. The molecules of a given sample are ionized and the first spectrometer (designated MS1) separates these ions by their mass-to-charge ratio (often given as m/z or m/Q).

Secondary ion mass spectrometry

Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of the surface to a depth of 1 to 2 nm.

Related publications (3)

Compound clusters

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