Publication

Method and apparatus for identifying local features

Martin Vetterli
2014
Patents

Abstract

A method of local feature identification, comprising the steps of: retrieving data representing a lightfield (101); forming an epipolar volume (V) from the retrieved data; applying a transform to epipolar planes retrieved from said epipolar volume, so as to represent said epipolar planes in a new space (106); identifying a plurality of epipolar lines (107); identifying local features (fp) based on at least some of said epipolar lines (108).

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Method and apparatus for identifying local features

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