Publication

28-nm Bulk and FDSOI Cryogenic MOSFET (Invited Paper)

Christian Enz, Farzan Jazaeri, Arnout Lodewijk M Beckers
2018
Conference Papers

Abstract

This paper presents an intensive overview of the characterization and modeling of advanced 28-nm hulk and FDSOI CMOS processes operating continuously from room down to deep cryogenic temperature.

Official source

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28-nm Bulk and FDSOI Cryogenic MOSFET (Invited Paper)

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