Publication

Hardness and microstructural variation of Al-Mg-Mn-Sc-Zr alloy

Pierre Burdet
2016
Journal Articles

Abstract

Variations of Vickers hardness were observed in Al-Mg-Mn alloy and Al-Mg-Mn-Sc-Zr alloy at different ageing times, ranging from a peak value of 81.2 HV at 54 ks down to 67.4 HV at 360 ks, below the initial hardness value, 71.8 HV at 0 ks for the case of Al-Mg-Mn-Sc-Zr alloy. Microstructures of samples at each ageing stage were examined carefully by transmission electron microscopes (TEMs) both in two-dimensions and three-dimensions. The presence of different types, densities, and sizes of particles were observed dispersed spherical Al3Sc1-xZrx and also block-shaped Al3Sc precipitates growing along (Al) with facets {1 0 0} and {1 1 0} of the precipitates. TEM analysis both in two-dimensions and three-dimensions, performed on various samples, confirmed the direct correlation between the hardness and the density of Al3Sc. (C) 2015 Elsevier Ltd. All rights reserved.

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https://infoscience.epfl.ch/entities/publication/bff68a4d-d174-4cf2-815e-f0155567720d

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Pierre Burdet
2016
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/bff68a4d-d174-4cf2-815e-f0155567720d

About this result

Related concepts (20)

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Transmission electron cryomicroscopy

Transmission electron cryomicroscopy (CryoTEM), commonly known as cryo-EM, is a form of cryogenic electron microscopy, more specifically a type of transmission electron microscopy (TEM) where the sample is studied at cryogenic temperatures (generally liquid-nitrogen temperatures). Cryo-EM is gaining popularity in structural biology. The utility of transmission electron cryomicroscopy stems from the fact that it allows the observation of specimens that have not been stained or fixed in any way, showing them in their native environment.

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