Publication

RTS Noise Characterization in Single-Photon Avalanche Diodes

Edoardo Charbon, Cristiano Niclass, Lucio Carrara
2010
Journal Articles

Abstract

Random telegraph signal (RTS) behavior is reported and characterized in the dark count rate of single-photon avalanche Diodes (SPADs). The RTS is observed in a SPAD fabricated in 0.8-mu m CMOS technology and in four proton-irradiated SPADs designed and fabricated in 0.35-mu m CMOS technology. The RTS characteristics are evaluated experimentally and verified theoretically with respect to bias and temperature.

Official source

https://infoscience.epfl.ch/entities/publication/bab3dd92-4502-4f5a-ba9e-d7124ee229e9

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RTS Noise Characterization in Single-Photon Avalanche Diodes

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