Publication

Nanoscale depth-resolved coherent femtosecond motion in laser-excited bismuth

Paul Beaud
2008
Journal Articles

Abstract

We employ grazing-incidence femtosecond x-ray diffraction to characterize the coherent, femtosecond laser-induced lattice motion of a bismuth crystal as a function of depth from the surface with a temporal resolution of 193 +/- 8 fs. The data show direct consequences on the lattice motion from carrier diffusion and electron-hole interaction, allowing us to estimate an effective diffusion rate of D=2.3 +/- 0.3 cm(2)/s for the highly excited carriers and an electron-hole interaction time of 260 +/- 20 fs.

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https://infoscience.epfl.ch/entities/publication/b6cd449a-f599-4293-a6bc-2d333a271771

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Paul Beaud
2008
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/b6cd449a-f599-4293-a6bc-2d333a271771

About this result

Related concepts (15)

Electron hole

In physics, chemistry, and electronic engineering, an electron hole (often simply called a hole) is a quasiparticle denoting the lack of an electron at a position where one could exist in an atom or atomic lattice. Since in a normal atom or crystal lattice the negative charge of the electrons is balanced by the positive charge of the atomic nuclei, the absence of an electron leaves a net positive charge at the hole's location. Holes in a metal or semiconductor crystal lattice can move through the lattice as electrons can, and act similarly to positively-charged particles.

Electron mobility

In solid-state physics, the electron mobility characterises how quickly an electron can move through a metal or semiconductor when pulled by an electric field. There is an analogous quantity for holes, called hole mobility. The term carrier mobility refers in general to both electron and hole mobility. Electron and hole mobility are special cases of electrical mobility of charged particles in a fluid under an applied electric field. When an electric field E is applied across a piece of material, the electrons respond by moving with an average velocity called the drift velocity, .

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

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