Publication

Degradation of electron-beam-pumped Zn1-xCdxSe/ZnSe GRINSCH blue-green lasers

Jean-Daniel Ganière
1997
Book Chapters

Abstract

We explored the degradation in electron beam pumped Zn1-xCdxSe/ZnSe laser structures by combining cathodoluminescence measurements in a scanning electron microscope with transmission electron microscopy. We found that degradation occurred via the formation of dark spot and dark line defects, and that it involved the formation of a characteristic type of defect, namely dislocation loops within the ZnCdSe quantum well, which grew to form a characteristic network as degradation progressed.

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Jean-Daniel Ganière
1997
Book Chapters

Abstract

Official source

Related concepts (32)

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

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Degradation of electron-beam-pumped Zn1-xCdxSe/ZnSe GRINSCH blue-green lasers

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