Publication

Cryogenic RF Characterization and Simple Modeling of a 22 nm FDSOI Technology

Edoardo Charbon, Christian Enz, Farzan Jazaeri, Hung-Chi Han, Antonio D'Amico
2022
Conference Papers

Abstract

This paper presents the RF characterization and modeling of a 22nm FDSOI technology down to 3.3K for quantum computing applications. The equivalent small-signal components are extracted analytically and automatically from the de-embedded two-port Y -parameters using an iteratively re-weighted least-squares method. The dynamic self-heating effect impacting R(Y-22) is characterized at different temperatures and bias points.

Official source

https://infoscience.epfl.ch/entities/publication/9fcc903a-e1a2-423c-a129-e975b24eef8f

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Cryogenic RF Characterization and Simple Modeling of a 22 nm FDSOI Technology

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