Publication

PZT phase formation monitored by high-temperature X-ray diffractometry

Nava Setter
1997
Journal Articles

Abstract

The crystallisation kinetics of amorphous sol-gel PZT thin films were investigated using high-temperature X-my diffraction. Crystallisation for different isotherms was monitored as a function of time. Phase transformation data were obtained from integrated X-ray peak intensities which were calibrated based on image analysis of the surface microstructure of the samples at the end of the isothermal treatments. An activation energy of 310 kJ/mol was obtained without assuming a specific kinetic model. Front the transformation data, a TTT diagram was constructed for the ranges studied. (C) 1997 Elsevier Science Limited.

Official source

https://infoscience.epfl.ch/entities/publication/9213fb49-34ea-49ef-8b07-51b38958eed5

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Nava Setter
1997
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/9213fb49-34ea-49ef-8b07-51b38958eed5

About this result

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