Publication

A Miniaturized Biaxial Deformation Rig for in Situ Mechanical Testing

Helena Van Swygenhoven, Steven Van Petegem
2017
Journal Articles

Abstract

A novel miniaturized biaxial deformation rig is presented. It allows one to apply in-plane biaxial stress states with arbitrary stress ratios and to perform strain path changes on thin-sheet metals. The device is optimized for in situ usage inside a scanning electron microscope and at synchrotron beam lines. The sample has a cruciform shape and the geometry is optimized with the aid of finite element simulations. A proof-of-principle experiment confirms the successful operation of this rig.

Official source

https://infoscience.epfl.ch/entities/publication/8a6edd6b-f45e-456a-8d5e-c0c1a9a2d0b2

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Helena Van Swygenhoven, Steven Van Petegem
2017
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/8a6edd6b-f45e-456a-8d5e-c0c1a9a2d0b2

About this result

Related concepts (31)

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Scanning tunneling microscope

A scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1 nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated.

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A Miniaturized Biaxial Deformation Rig for in Situ Mechanical Testing

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