Publication

High-Resolution Electron Microscopy (HREM) on Icosahedral Gold Small Particles: Image Simulation and Observations

1988
Journal Articles

Abstract

The "multislice" method is used to simulate HREM images of gold particles. The 1024 × 1024 sampling of the supercells and the implementation on a CRAY 1S/2300 computer enable for the first time the accurate calculation of images of icosahedral aggregates containing up to 2869 atoms. The agreement with observations is very good for images along a threefold symmetry axis. For the fivefold symmetry, the computed contrasts clearly explain some anomalous observed features.

Official source

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1988
Journal Articles

Abstract

Official source

Related concepts (24)

Electron crystallography

Electron crystallography is a method to determine the arrangement of atoms in solids using a transmission electron microscope (TEM). It can involve the use of high-resolution transmission electron microscopy images, electron diffraction patterns including convergent-beam electron diffraction or combinations of these. It has been successful in determining some bulk structures, and also surface structures. Two related methods are low-energy electron diffraction which has solved the structure of many surfaces, and reflection high-energy electron diffraction which is used to monitor surfaces often during growth.

Symmetry

Symmetry () in everyday language refers to a sense of harmonious and beautiful proportion and balance. In mathematics, the term has a more precise definition and is usually used to refer to an object that is invariant under some transformations, such as translation, reflection, rotation, or scaling. Although these two meanings of the word can sometimes be told apart, they are intricately related, and hence are discussed together in this article.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.