Publication

On the Reliability of Post-CMOS and SET Systems

Yusuf Leblebici, Alexandre Schmid, Milos Stanisavljevic
2009
Journal Articles

Abstract

The necessity of applying fault-tolerant techniques to increase the reliability of future nano-electronic systems is an undisputed fact, dictated by the high density of faults that will plague these chips. The averaging and thresholding fault-tolerant technique that has proven remarkable efficiency in CMOS is presented for SET-based designs. Computer simulations demonstrate the superiority of this fault-tolerant technique over other methods, which is specifically the case when an adaptable threshold is used.

Official source

https://infoscience.epfl.ch/entities/publication/81511303-555f-44d8-94db-5b45d38bee9f

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On the Reliability of Post-CMOS and SET Systems

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