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Publication

Microstructure and mechanical properties of a W-2wt.%Y2O3 composite produced by sintering and hot forging

Nadine Baluc, Philippe Spätig, Robin Schäublin
2013
Journal Articles

Abstract

A W-2Y(2)O(3) composite has been developed by powder metallurgy methods in collaboration with the Plansee Company (Austria). The microstructure of the composite was analyzed using transmission electron microscopy and electron backscatter diffraction in scanning electron microscopy. The mechanical properties of the composite were analyzed using nano-indentation experiments, tensile and Charpy impact tests. It was mainly found that the composite exhibits ductile tensile behavior at 673-1273 K but weak Charpy impact properties, characterized by low absorbed energy values, at 773-1273 K. (C) 2013 Elsevier B.V. All rights reserved.

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https://infoscience.epfl.ch/entities/publication/7866e491-b195-4eab-8039-7efa70ffa0c2

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Nadine Baluc, Philippe Spätig, Robin Schäublin
2013
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/7866e491-b195-4eab-8039-7efa70ffa0c2

About this result

Related concepts (22)

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

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