Bridge circuitA bridge circuit is a topology of electrical circuitry in which two circuit branches (usually in parallel with each other) are "bridged" by a third branch connected between the first two branches at some intermediate point along them. The bridge was originally developed for laboratory measurement purposes and one of the intermediate bridging points is often adjustable when so used. Bridge circuits now find many applications, both linear and non-linear, including in instrumentation, filtering and power conversion.
Computational geometryComputational geometry is a branch of computer science devoted to the study of algorithms which can be stated in terms of geometry. Some purely geometrical problems arise out of the study of computational geometric algorithms, and such problems are also considered to be part of computational geometry. While modern computational geometry is a recent development, it is one of the oldest fields of computing with a history stretching back to antiquity.
Pressure measurementPressure measurement is the measurement of an applied force by a fluid (liquid or gas) on a surface. Pressure is typically measured in units of force per unit of surface area. Many techniques have been developed for the measurement of pressure and vacuum. Instruments used to measure and display pressure mechanically are called pressure gauges, vacuum gauges or compound gauges (vacuum & pressure). The widely used Bourdon gauge is a mechanical device, which both measures and indicates and is probably the best known type of gauge.
Input deviceIn computing, an input device is a piece of equipment used to provide data and control signals to an information processing system, such as a computer or information appliance. Examples of input devices include keyboards, mouse, s, cameras, joysticks, and microphones. Input devices can be categorized based on: modality of input (e.g., mechanical motion, audio, visual, etc.) whether the input is discrete (e.g., pressing of key) or continuous (e.g.
Cross section (geometry)In geometry and science, a cross section is the non-empty intersection of a solid body in three-dimensional space with a plane, or the analog in higher-dimensional spaces. Cutting an object into slices creates many parallel cross-sections. The boundary of a cross-section in three-dimensional space that is parallel to two of the axes, that is, parallel to the plane determined by these axes, is sometimes referred to as a contour line; for example, if a plane cuts through mountains of a raised-relief map parallel to the ground, the result is a contour line in two-dimensional space showing points on the surface of the mountains of equal elevation.
Mechanical filterA mechanical filter is a signal processing filter usually used in place of an electronic filter at radio frequencies. Its purpose is the same as that of a normal electronic filter: to pass a range of signal frequencies, but to block others. The filter acts on mechanical vibrations which are the analogue of the electrical signal. At the input and output of the filter, transducers convert the electrical signal into, and then back from, these mechanical vibrations.
Dynamic mechanical analysisDynamic mechanical analysis (abbreviated DMA) is a technique used to study and characterize materials. It is most useful for studying the viscoelastic behavior of polymers. A sinusoidal stress is applied and the strain in the material is measured, allowing one to determine the complex modulus. The temperature of the sample or the frequency of the stress are often varied, leading to variations in the complex modulus; this approach can be used to locate the glass transition temperature of the material, as well as to identify transitions corresponding to other molecular motions.
Deflection (engineering)In structural engineering, deflection is the degree to which a part of a structural element is displaced under a load (because it deforms). It may refer to an angle or a distance. The deflection distance of a member under a load can be calculated by integrating the function that mathematically describes the slope of the deflected shape of the member under that load. Standard formulas exist for the deflection of common beam configurations and load cases at discrete locations.
Euclidean geometryEuclidean geometry is a mathematical system attributed to ancient Greek mathematician Euclid, which he described in his textbook on geometry, Elements. Euclid's approach consists in assuming a small set of intuitively appealing axioms (postulates) and deducing many other propositions (theorems) from these. Although many of Euclid's results had been stated earlier, Euclid was the first to organize these propositions into a logical system in which each result is proved from axioms and previously proved theorems.
GeometryGeometry (; ) is a branch of mathematics concerned with properties of space such as the distance, shape, size, and relative position of figures. Geometry is, along with arithmetic, one of the oldest branches of mathematics. A mathematician who works in the field of geometry is called a geometer. Until the 19th century, geometry was almost exclusively devoted to Euclidean geometry, which includes the notions of point, line, plane, distance, angle, surface, and curve, as fundamental concepts.
Mechanical–electrical analogiesMechanical–electrical analogies are the representation of mechanical systems as electrical networks. At first, such analogies were used in reverse to help explain electrical phenomena in familiar mechanical terms. James Clerk Maxwell introduced analogies of this sort in the 19th century. However, as electrical network analysis matured it was found that certain mechanical problems could more easily be solved through an electrical analogy.
Atomic force microscopyAtomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
