Publication

The growth and properties of single crystals of GaInTe2, a ternary chalcogenide semiconductor

Giorgio Margaritondo, Helmuth Berger
1998
Journal Articles

Abstract

Single crystals of GaInTe2 were grown from a melt and characterized by various experimental techniques, such as x-ray diffraction, x-ray photoelectron spectroscopy (XPS), and electrical and photoluminescence (PL) measurements. Our investigation evaluated important parameters of this challenging material. In particular, we studied here for the first time the electronic structure, the excitonic effects and the impurity bound states of GaInTe2, by means of XPS and by analysing dependences on the temperature and the excitation intensity of the PL spectra.

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https://infoscience.epfl.ch/entities/publication/68cd8a29-1f0c-4386-81f2-c82097a94550

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Giorgio Margaritondo, Helmuth Berger
1998
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/68cd8a29-1f0c-4386-81f2-c82097a94550

About this result

Related concepts (26)

Crystal structure

In crystallography, crystal structure is a description of the ordered arrangement of atoms, ions, or molecules in a crystalline material. Ordered structures occur from the intrinsic nature of the constituent particles to form symmetric patterns that repeat along the principal directions of three-dimensional space in matter. The smallest group of particles in the material that constitutes this repeating pattern is the unit cell of the structure.

X-ray crystallography

X-ray crystallography is the experimental science determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract into many specific directions. By measuring the angles and intensities of these diffracted beams, a crystallographer can produce a three-dimensional picture of the density of electrons within the crystal. From this electron density, the mean positions of the atoms in the crystal can be determined, as well as their chemical bonds, their crystallographic disorder, and various other information.

Powder diffraction

Powder diffraction is a scientific technique using X-ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. An instrument dedicated to performing such powder measurements is called a powder diffractometer. Powder diffraction stands in contrast to single crystal diffraction techniques, which work best with a single, well-ordered crystal. Diffraction grating The most common type of powder diffraction is with x-rays, the focus of this article although some aspects of neutron powder diffraction are mentioned.

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