Publication

X-Ray Secondary-Emission Microscopy (Xsem) of Neurons

Giorgio Margaritondo
1992
Journal Articles

Abstract

We present the first X-ray secondary (photoelectron) emission microscopy (XSEM) pictures and video microimages of an uncoated and unstained neuron specimen. This novel kind of synchrotron radiation microscopy is suitable for local chemical analysis with a lateral resolution in the micron range. We explored the details of the neuron system, demonstrated chemical contrast by scanning the photon energy, studied in real time the photoelectron emitting properties of the specimen's components, and made preliminary tests of the radiation damage. These results significantly enhance the potential role of photoemission techniques in the life sciences and specifically in neurobiology.

Official source

https://infoscience.epfl.ch/entities/publication/641f9a32-737d-4185-83b7-55f1d5b22456

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Giorgio Margaritondo
1992
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/641f9a32-737d-4185-83b7-55f1d5b22456

About this result

Related concepts (32)

X-ray photoelectron spectroscopy

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to.

Microscopy

Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye (objects that are not within the resolution range of the normal eye). There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy. Optical microscopy and electron microscopy involve the diffraction, reflection, or refraction of electromagnetic radiation/electron beams interacting with the specimen, and the collection of the scattered radiation or another signal in order to create an image.

Super-resolution microscopy

Super-resolution microscopy is a series of techniques in optical microscopy that allow such images to have resolutions higher than those imposed by the diffraction limit, which is due to the diffraction of light. Super-resolution imaging techniques rely on the near-field (photon-tunneling microscopy as well as those that use the Pendry Superlens and near field scanning optical microscopy) or on the far-field.

Related publications (32)

X-Ray Secondary-Emission Microscopy (Xsem) of Neurons

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