Publication

Shadow bands in overdoped Bi2Sr2CaCu2O8+x

Giorgio Margaritondo
1997
Journal Articles

Abstract

We performed angle-resolved photoemission experiments on overdoped single crystal Bi2Sr2CaCu2O8+x samples with Tc values as low as 55K and very narrow transitions as measured by AC susceptibility. The photoemission data indicate the presence of a ''shadow'' peak in the quasiparticle spectral function A(omega) shifted by (pi, pi) from the conventional quasiparticle peak. The ratio of the shadow/quasiparticle peak amplitudes strongly increases with the binding energy. This is consistent with the idea that the shadow peak is not a structural replica of the quasiparticle peak, but rather a maximum in a spectral function which can exist due to interaction with spin fluctuations peaked at (pi, pi). (C) 1997 Published by Elsevier Science Ltd.

Official source

https://infoscience.epfl.ch/entities/publication/639bede3-227d-4b18-9344-3244e0dde925

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Giorgio Margaritondo
1997
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/639bede3-227d-4b18-9344-3244e0dde925

About this result

Related concepts (26)

Angle-resolved photoemission spectroscopy

Angle-resolved photoemission spectroscopy (ARPES) is an experimental technique used in condensed matter physics to probe the allowed energies and momenta of the electrons in a material, usually a crystalline solid. It is based on the photoelectric effect, in which an incoming photon of sufficient energy ejects an electron from the surface of a material. By directly measuring the kinetic energy and emission angle distributions of the emitted photoelectrons, the technique can map the electronic band structure and Fermi surfaces.

Photoelectric effect

The photoelectric effect is the emission of electrons when electromagnetic radiation, such as light, hits a material. Electrons emitted in this manner are called photoelectrons. The phenomenon is studied in condensed matter physics, solid state, and quantum chemistry to draw inferences about the properties of atoms, molecules and solids. The effect has found use in electronic devices specialized for light detection and precisely timed electron emission.

X-ray photoelectron spectroscopy

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to.