Publication

Using diffusion-relaxation MRI to estimate the inner radius of co-electrospun axon-mimicking fibres

Jean-Philippe Thiran
2023

Abstract

A new approach for estimating inner axon radii from intra-axonal T2 relaxation times was recently proposed. However, further validations are required before this technique can be used widely. The main aim of this study is to validate this T2-based pore size estimation technique in phantoms comprising co-electrospun hollow axon-mimicking fibres designed to have non-circular cross-sections and different radii distributions. For this purpose, a diffusion-relaxation MRI dataset was acquired with a 7T preclinical scanner, from which the intra-fibre T2 times and pore sizes were estimated. The resulting pore sizes were compared to those measured from Scanning Electron Microscope images.

Official source

https://infoscience.epfl.ch/entities/publication/56c69f7e-77bc-42d7-a230-7d6eeaecc57e

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Graph Chat

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Jean-Philippe Thiran
2023

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/56c69f7e-77bc-42d7-a230-7d6eeaecc57e

About this result

Related concepts (25)

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Scanning tunneling microscope

A scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1 nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated.

Related publications (16)

Using diffusion-relaxation MRI to estimate the inner radius of co-electrospun axon-mimicking fibres

Chat with Graph Search

Fourier optical route toward multimodal differential microscopy

A Comprehensive Analysis of Combined AFM/SEM Systems for In-Situ Nanoscale Characterizations and Multiparametric Correlative Microscopy

Separate-scan atomic force microscope for fast infrared scattering-type scanning near-field optical microscope