Publication

Uniformly Flat Gold Surfaces: Imaging the Domain Structure of Organic Monolayers Using Scanning Force Microscopy

Horst Arthur Vogel, Andrzej Kulik, Dimitrios Stamou
1997
Journal Articles

Abstract

A simple method has been developed for the prodn. of Au surfaces which are uniformly flat over large areas. Si wafers serve as substrates for the evapn. of thin Au layers. A glass slide glued onto the Au film allows successful sepn. of the Au layer from the Si oxide surface. The process leaves a flat Au surface suitable for chem. modification. The surfaces were characterized using scanning force microscopy. An av. roughness of 2.5 .ANG. over areas up to 1000 mm2 was found. Scanning force microscopy images on the micron scale of lipid monolayer structures transferred onto these Au surfaces were obtained. [on SciFinder (R)]

Official source

https://infoscience.epfl.ch/entities/publication/548a435b-5307-4b40-8d40-9bc3d107b067

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Horst Arthur Vogel, Andrzej Kulik, Dimitrios Stamou
1997
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/548a435b-5307-4b40-8d40-9bc3d107b067

About this result

Related concepts (32)

Scanning probe microscopy

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Related publications (32)

Uniformly Flat Gold Surfaces: Imaging the Domain Structure of Organic Monolayers Using Scanning Force Microscopy

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