Publication

Thermo-refractive noise in silicon nitride microresonators

Tobias Kippenberg, Junqiu Liu, Erwan Guillaume Albert Lucas, Guanhao Huang
2019
Conference Papers

Abstract

Thermodynamic noises limit the frequency stability of resonators. Here, we present the first complete characterization of thermo-refractive noise in Si3N4 microresonators. The measurements are in good agreement with theoretical analysis and FEM simulation of the structures. (c) 2019 The Author(s)

Official source

https://infoscience.epfl.ch/entities/publication/512bd6c2-3e81-482e-9577-5fa741a82a7b

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Thermo-refractive noise in silicon nitride microresonators

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