Publication

Dielectric versus topographic contrast in near-field microscopy

1996
Journal Articles

Abstract

Using a fully vectorial three-dimensional numerical approach (generalized field propagator, based on Green's tensor technique), we investigate the near-field images produced by subwavelength objects buried in a dielectric surface. We study the influence of the object index, size, and depth on the near field. We emphasize the similarity between the near field spawned by an object buried in the surface (dielectric contrast) and that spawned by a protrusion on the surface (topographic contrast). We show that a buried object with a negative dielectric contrast (i.e., with a smaller index than its surrounding medium) produces a near-field image that is reversed from that of an object with a positive contrast. (C) 1996 Optical Society of America.

Official source

https://infoscience.epfl.ch/entities/publication/4e8dd918-f08b-45a9-850a-8e74e3316941

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Graph Chat

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

1996
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/4e8dd918-f08b-45a9-850a-8e74e3316941

About this result

Related concepts (31)

Near-field scanning optical microscope

Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. In SNOM, the excitation laser light is focused through an aperture with a diameter smaller than the excitation wavelength, resulting in an evanescent field (or near-field) on the far side of the aperture.

Permittivity

In electromagnetism, the absolute permittivity, often simply called permittivity and denoted by the Greek letter ε (epsilon), is a measure of the electric polarizability of a dielectric. A material with high permittivity polarizes more in response to an applied electric field than a material with low permittivity, thereby storing more energy in the material. In electrostatics, the permittivity plays an important role in determining the capacitance of a capacitor.

Near and far field

The near field and far field are regions of the electromagnetic (EM) field around an object, such as a transmitting antenna, or the result of radiation scattering off an object. Non-radiative near-field behaviors dominate close to the antenna or scattering object, while electromagnetic radiation far-field behaviors dominate at greater distances. Far-field E (electric) and B (magnetic) field strength decreases as the distance from the source increases, resulting in an inverse-square law for the radiated power intensity of electromagnetic radiation.

Related publications (29)

Dielectric versus topographic contrast in near-field microscopy

Chat with Graph Search

Observation of Spin-Duality Breaking in Pancharatnam-Berry Metasurfaces

Fourier optical route toward multimodal differential microscopy

Time-of-flight fluorescence depth mapping using a spatiotemporal deep learning model