Publications related to 25th Anniversary of STED Microscopy and the 20th Anniversary of SIM: feature introduction

Related publications (41)

Image scanning microscopy with a doughnut beam: signal strength and integrated intensity

We discuss the effects of image scanning microscopy using doughnut beam illumination on the properties of signal strength and integrated intensity. Doughnut beam illumination can give better optical sectioning and background rejection than Airy disk illumi ...

Optica Publishing Group2023