Publication

25th Anniversary of STED Microscopy and the 20th Anniversary of SIM: feature introduction

Suliana Manley
2020
Journal Articles

Abstract

This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy in Optics Letters in 1994. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

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25th Anniversary of STED Microscopy and the 20th Anniversary of SIM: feature introduction

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