Publication

Reliability of 1310 nm Wafer Fused VCSELs

Elyahou Kapon, Vladimir Iakovlev, Alexei Sirbu, Alexandru Mereuta, Andrei Caliman, Grigore Suruceanu, Zlatko Mickovic
2013
Journal Articles

Abstract

Wafer fusion vertical cavity surface emitting laser (VCSEL) technology has produced devices that successfully passed all mechanical and electrical Telcordia qualification tests. Accelerated lifetime tests result in times to 1% failure at 70 degrees C of 18 years and 30 years at VCSEL driving currents of 9 and 8 mA, respectively. These lifetimes meet the telecom industry reliability requirements for applications in fiber-optic communications networks.

Official source

https://infoscience.epfl.ch/entities/publication/38cadb85-0284-4b46-9c68-c78a22fbc240

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Reliability of 1310 nm Wafer Fused VCSELs

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