Publication

Characterization of Microwave Substrates for High Accuracy and Long-Term Stability Using Full-Wave Microstrip Ring Resonator Method

Anja Skrivervik, Yuanyan Su, Miroslav Veljovic
2021
Conference Papers

Abstract

An accurate material characterization method for microwave printed-circuit-board substrates is proposed by combining the microwave ring resonator method with iterative full-wave simulations. A detailed error analysis is performed quantitatively to compensate the discrepancy between the estimated value and the actual permittivity. The improved estimation accuracy is a necessity for some highly-precise microwave devices. In addition, the permittivity of FR4 substrate at 109 degrees C operating temperature as a function of time is investigated to validate its long-term stability.

Official source

https://infoscience.epfl.ch/entities/publication/37ea0799-8179-41f5-9391-bc151259c560

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Characterization of Microwave Substrates for High Accuracy and Long-Term Stability Using Full-Wave Microstrip Ring Resonator Method

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