Publication

A low-temperature ultrahigh vacuum atomic force microscope for biological applications

Giovanni Dietler
2003
Journal Articles

Abstract

We present an atomic force microscope ~AFM for operation at low temperatures under ultrahigh vacuum conditions. It uses the laser beam deflection method to measure the bending of the cantilever. The four quadrant photodiode allows the detection of vertical and lateral forces. The AFM has been developed for studying biological samples. Images of deoxyribonucleic acid plasmids have been obtained in contact mode.

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Giovanni Dietler
2003
Journal Articles

Abstract

Official source

Related concepts (13)

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Scanning probe microscopy

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

Optical tweezers

Optical tweezers (originally called single-beam gradient force trap) are scientific instruments that use a highly focused laser beam to hold and move microscopic and sub-microscopic objects like atoms, nanoparticles and droplets, in a manner similar to tweezers. If the object is held in air or vacuum without additional support, it can be called optical levitation. The laser light provides an attractive or repulsive force (typically on the order of piconewtons), depending on the relative refractive index between particle and surrounding medium.

Related publications (3)

A low-temperature ultrahigh vacuum atomic force microscope for biological applications

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Scanning probe microscope

Assessing the electric field sensitivity measured by pixelated differential phase contrast imaging in vacuum both in the absence of external fields and under field-bound conditions

Nanostenciling: a Versatile Approach for Surfaces Patterning