Publication

Superlattice Nanowires

Jean-Philippe Ansermet
1995
Journal Articles

Abstract

CoNiCu/Cu superlattice nanowires have been grown by electrodeposition in nuclear tracketched nanoporous membranes. Transmission electron microscopy (TEM) images show a good layer structure and allow an estimate of the current efficiency. Current perpendicular to plane (CPP) giant magnetoresistance of up to 22%, at ambient temperature, has been measured but appears to be limited by defects, giving rise to ferromagnetic interlayer coupling, at low nonmagnetic layer thicknesses. Magnetic properties of the superlattice nanowires are influenced by in-plane anisotropy and magnetostatic coupling.

Official source

https://infoscience.epfl.ch/entities/publication/30479f80-cef6-4c81-aef2-3f487a7bffb1

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Jean-Philippe Ansermet
1995
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/30479f80-cef6-4c81-aef2-3f487a7bffb1

About this result

Related concepts (32)

Tunnel magnetoresistance

Tunnel magnetoresistance (TMR) is a magnetoresistive effect that occurs in a magnetic tunnel junction (MTJ), which is a component consisting of two ferromagnets separated by a thin insulator. If the insulating layer is thin enough (typically a few nanometres), electrons can tunnel from one ferromagnet into the other. Since this process is forbidden in classical physics, the tunnel magnetoresistance is a strictly quantum mechanical phenomenon. Magnetic tunnel junctions are manufactured in thin film technology.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

Related publications (32)

Superlattice Nanowires

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