Publication

Singlemode chalcogenide fiber infrared SNOM probes

Giorgio Margaritondo
1999
Journal Articles

Abstract

We have fabricated and tested infrared scanning near-field optical microscope (IR-SNOM) probe tips made from singlemode chalcogenide fiber. The process used to create the tips was similar to conventional micropipette-puller techniques, with some modifications to allow for the lower melting temperature and tensile strength of the chalcogenide fiber. SEM micrographs, showing tips with sub-micrometer physical dimensions, demonstrate the feasibility of this process. Topographical data obtained using a shear-force near-field microscope exhibits spatial resolution in the range 80-100 nm. Optical data in the infrared (near 3.5 mu m), using the probe tips in collection mode, indicates an optical spatial resolution approximately lambda/15. (C) 1999 Published by Elsevier Science B.V. hll rights reserved.

Official source

https://infoscience.epfl.ch/entities/publication/23bd6452-782d-40d6-a210-b76c307ecde8

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Giorgio Margaritondo
1999
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/23bd6452-782d-40d6-a210-b76c307ecde8

About this result

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Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

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