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We present a radiation-tolerant 120 dB dynamic-range interface circuit for ionization chambers and diamond detectors. The device consists of a multi-scale continuous-time incremental charge-to-digital converter paired with a temperature-compensated current reference. The circuit selects the sensitivity according to the input signal level and provides a 20-bit plus sign output code every 40 mu s. The proposed interface circuit achieves a measurement linearity error better than +/- 5% in the 40 fC-42 nC range. The ASIC has been designed for radiation-tolerance in a 0.25 mu m 3M1P CMOS technology and tested for TID up to 100 kGy(Si), showing uninterrupted functionality. The conversion reference drifts of 3% at 100 kGy(Si) and its temperature coefficient is less than 600 ppm/degrees C. (C) 2013 Elsevier Ltd. All rights reserved.
Nicolas Würsch, Jonathan Emanuel Thomet, Luca Massimiliano Antognini, Sylvain Dunand
Stefano Coda, Basil Duval, Umar Sheikh, Claudia Colandrea, Luke Simons, Jean Arthur Cazabonne