Publication

Physicochemical properties of SnO2-Sb2O5 films prepared by the spray pyrolysis technique

Christos Comninellis
1996
Journal Articles

Abstract

The properties of SnO2-Sb2O5 mixed-oxide films prepd. by the spray pyrolysis method were studied under different synthesis conditions. The film d., measured by profilometry and by a spectrophotometric method, was close to that reported in the literature for cryst. tin dioxide. Anal. by energy dispersive spectrometry and x-ray photo-electron spectroscopy showed that the Sb/Sn atom ratio in the films was in all cases about 2.5 times larger with respect to that in the precursor soln. Microstructural characterization by wide-angle x-ray scattering indicates that the deposits consist of large sized crystallites. The influence of the substrate temp. (T) on the av. crystallite size (l) has shown that l decreases linearly with T. SEM showed that the surface of films thinner than 0.5-0.8 mm is flat with only a limited no. of emerging particles. [on SciFinder (R)]

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https://infoscience.epfl.ch/entities/publication/1e60a894-2254-4e1f-8b67-c5fb09aa81ff

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Christos Comninellis
1996
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/1e60a894-2254-4e1f-8b67-c5fb09aa81ff

About this result

Related concepts (32)

X-ray spectroscopy

X-ray spectroscopy is a general term for several spectroscopic techniques for characterization of materials by using x-ray radiation. When an electron from the inner shell of an atom is excited by the energy of a photon, it moves to a higher energy level. When it returns to the low energy level, the energy which it previously gained by the excitation is emitted as a photon which has a wavelength that is characteristic for the element (there could be several characteristic wavelengths per element).

X-ray crystallography

X-ray crystallography is the experimental science determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract into many specific directions. By measuring the angles and intensities of these diffracted beams, a crystallographer can produce a three-dimensional picture of the density of electrons within the crystal. From this electron density, the mean positions of the atoms in the crystal can be determined, as well as their chemical bonds, their crystallographic disorder, and various other information.

X-ray photoelectron spectroscopy

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to.

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Physicochemical properties of SnO2-Sb2O5 films prepared by the spray pyrolysis technique

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